Reconfigurable logic gates using single-electron spin transistors

We propose and numerically analyze novel reconfigurable logic gates using single-electron spin transistors (SESTs), which are single-electron transistors (SETs) with ferromagnetic electrodes and islands. The output characteristics of a SEST depend on the relative magnetization configuration of the ferromagnetic island with respect to the magnetization of the source and the drain, i.e., high current drive capability in parallel magnetization and low current drive capability in antiparallel magnetization. The summation of multiple input signals can be achieved by directly coupling multiple input gate electrodes to the SEST island, without using a floating gate. A Tucker-type inverter with a variable threshold voltage, a reconfigurable AND/OR logic gate, and a reconfigurable logic gate for all symmetric Boolean functions are proposed and simulated using the Monte Carlo method.