期刊
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS
卷 46, 期 10A, 页码 6863-6864出版社
INST PURE APPLIED PHYSICS
DOI: 10.1143/JJAP.46.6863
关键词
optical disks; phase-change memory; Sb-Te alloys; thermal conductivity; thermoreflectance
Using a nanosecond thermoreflectance measurement system, which enables the measurement of the thermal conductivity of nanometer-scale thin films, we have measured the thermal conductivities of Sb2Te, Sb2Te3, SbTe9, Sb, and Te thin films at room temperature. We clarified that the thermal conductivities of Sb-Te alloys depend on the Sb and Te atomic ratios. A large change in thermal conductivity was observed in the vicinity of the composition ratio of Sb2Te3. We proposed that this large change may be attributable to the formation of an Sb atomic network in the crystalline structure of the Sb-Te alloy.
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