期刊
JOURNAL OF SOLID STATE ELECTROCHEMISTRY
卷 11, 期 10, 页码 1365-1373出版社
SPRINGER
DOI: 10.1007/s10008-007-0294-4
关键词
surface stress; underpotential deposition of copper; gold electrode; co-adsorption of anions; bending beam method
The changes in surface stress of the evaporated gold electrode (mainly oriented to the (111) plane) during underpotential deposition (UPD) of copper in 0.1 M sulfuric acid medium or 0.1 M perchloric acid medium with and without sulfate or chloride were measured using a bending beam method. The surface stress maximum of gold electrode appeared during Cu-UPD. The co-adsorption of (bi)sulfate or chloride ions with copper atoms induced the compressive surface stress to promote the Cu-UPD. The factors influencing the surface stress or surface elastic strain were discussed in relation to the Cu-UPD structure.
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