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X-ray Raman spectroscopic study of benzene at high pressure

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JOURNAL OF PHYSICAL CHEMISTRY B
卷 111, 期 40, 页码 11635-11637

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AMER CHEMICAL SOC
DOI: 10.1021/jp074321+

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We have used X-ray Raman spectroscopy (XRS) to study benzene up to similar to 20 GPa in a diamond anvil cell at ambient temperature. The experiments were performed at the High-Pressure Collaborative Access Team's 16 ID-D undulator beamline at the Advanced Photon Source. Scanned monochromatic X-rays near 10 keV were used to probe the carbon X-ray edge near 284 eV via inelastic scattering. The diamond cell axis was oriented perpendicular to the X-ray beam axis to prevent carbon signal contamination from the diamonds. Beryllium gaskets confined the sample because of their high transmission throughput in this geometry. Spectral alterations with pressure indicate bonding changes that occur with pressure because of phase changes (liquid: phase 1, 11, 111, and III') and possibly due to changes in the hybridization of the bonds. Changes in the XRS spectra were especially evident in the data taken when the sample was in phase III', which may be related to a rate process observed in earlier shock wave studies.

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