期刊
APPLIED PHYSICS LETTERS
卷 91, 期 16, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.2801357
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资金
- National Research Foundation of Korea [R0A-2007-000-20044-0] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
Current-voltage and conductance-voltage (G-V) measurements on three-layer Al/C-60/CdSe nanoparticles/C-60/indium tin oxide (ITO) structures fabricated by using a spin-coating method showed a nonvolatile electrical bistable behavior. Capacitance-voltage (C-V) measurements on Al/C-60/CdSe nanoparticles/C-60/ITO structures showed a clockwise hysteresis with a flatband voltage shift due to the existence of the CdSe nanoparticles, indicative of memory effects in the devices. Current-time measurements showed that the devices exhibited excellent memory retention ability at ambient conditions. Possible operating mechanisms for the memory effects in the Al/C-60/CdSe nanoparticles/C-60/ITO devices are described on the basis of the G-V and the C-V results. (C) 2007 American Institute of Physics.
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