期刊
ELECTRONICS LETTERS
卷 43, 期 22, 页码 1198-1199出版社
INST ENGINEERING TECHNOLOGY-IET
DOI: 10.1049/el:20072441
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A GaSb quantum-well (QW) laser diode grown monolithically on a 5 degrees miscut Si (001) substrate is presented. The III-Sb epi-structure is grown monolithically on the miscut Si substrate via a thin (50 nm) AlSb nucleation layer. The 13% lattice mismatch between AlSb and Si is accommodated by a self-assembled, 2D array of interfacial misfit dislocations (IMF). The 5 degrees miscut geometry enables simultaneous IMF formation and anti-phase domain suppression. The 1 mm x 100 mu m GaSb QW laser diode operates under pulsed conditions at 77 K with a threshold current density of 2 kA/cm(2) and a maximum peak power of similar to 20 mW Furthermore, the device is characterised by a 9.1 Omega forward resistance and a leakage current density of 0.7 A/cm(2) at -5 V.
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