4.6 Article Proceedings Paper

Ultra-wideband spectral analysis using S2 technology

期刊

JOURNAL OF LUMINESCENCE
卷 127, 期 1, 页码 116-128

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ELSEVIER
DOI: 10.1016/j.jlumin.2007.02.016

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spectrum analysis; spatial spectral holography; hole burning; spectral recovery

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This paper outlines the efforts to develop an ultra-wideband spectrum analyzer that takes advantage of the broad spectral response and fine spectral resolution (similar to 25 kHz) of spatial-spectral (S2) materials. The S2 material can process the full spectrum of broadband microwave transmissions, with adjustable time apertures (down to 100 mu s) and fast update rates (up to I kHz). A cryogenically cooled Tm:YAG crystal that operates on microwave signals modulated onto a stabilized optical carrier at 793 nm is used as the core for the spectrum analyzer. Efforts to develop novel component technologies that enhance the performance of the system and meet the application requirements are discussed, including an end-to-end device model for parameter optimization. We discuss the characterization of new ultra-wide bandwidth S2 materials. Detection and post-processing module development including the implementation of a novel spectral recovery algorithm using field programmable gate array technology (FPGA) is also discussed. (C) 2007 Elsevier B.V. All rights reserved.

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