期刊
JOURNAL OF SYNCHROTRON RADIATION
卷 14, 期 -, 页码 453-470出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0909049507037600
关键词
x-ray free-electron laser; coherent X-ray diffraction imaging; phase retrieval
资金
- EPSRC [EP/D052939/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/D052939/1] Funding Source: researchfish
Coherent X-ray diffraction imaging is a rapidly advancing form of lensless microscopy. The phase information of the diffraction pattern is embedded in a sufficiently sampled coherent diffraction pattern. Using advanced computational methods, this diffraction pattern can be inverted to produce an image of a sample with diffraction-limited resolution. It is attractive to use high-power coherent X-ray beams produced by future X-ray free-electron lasers for imaging nanoscale condensed matter, materials and biological samples. Here, the scientific case, requirements and the possible realisation of the coherent X-ray diffraction imaging beamlines at the European XFEL Facility are presented.
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