Structural study of Si(111)-6 x 1-Ag surface using surface X-ray diffraction

The surface structure of Si(111)-6 x 1-Ag was investigated using surface X-ray diffraction techniques. By analyzing the CTR scattering intensities along 00 rod, the positions of the Ag and reconstructed Si atoms perpendicular to the surface were determined. The results agreed well with the HCC model proposed for a 3 x 1 structure induced by alkali-metals on a Si(I 11) substrate. The heights of the surface Ag and Si atoms did not move when the surface structure changed from Si(111)-root 3 x root 3-Ag to Si(111)-6 x 1-Ag by the desorption of the Ag atoms. From the GIXD measurement, the in-plane arrangement of the surface Ag atoms was determined. The results indicate that the Ag atoms move large distances at the phase transition between the 6 x 1 and 3 x 1 structures. (C) 2007 Elsevier B.V. All rights reserved.