期刊
POWDER DIFFRACTION
卷 22, 期 4, 页码 312-315出版社
CAMBRIDGE UNIV PRESS
DOI: 10.1154/1.2793073
关键词
Gd117Fe52Ge112; crystal structure; Rietveld method; X-ray diffraction data
A new ternary compound Gd117Fe52Ge112 has been successfully synthesized and studied by means of X-ray powder diffraction technique. Gd117Fe52Ge112 crystallizes in a cubic Tb117Fe52Ge112-type structure with space group Fm (3) over barm(#225) and lattice parameter a=28.7680(1) angstrom. Crystal structure of Gd117Fe52Ge112 has been successfully refined using the Rietveld method from X-ray diffraction data. The R-factors for the Rietveld refinement are R-p=0.099 and R-wp=0.128. X-ray powder diffraction data with the figure of merit F-30 of 80.4(30) are also reported. (C) 2007 International Centre for Diffraction Data.
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