We measure a cryogenic, vacuum-gap capacitor by two methods: (1) charging it with a known number of electrons and measuring the resulting voltage, and (2) using a capacitance bridge traceable to the SI farad. We report a detailed uncertainty budget for the comparison of the two methods and find that they agree within a relative standard uncertainty of 9.2 x 10(-7). This comparison closes the quantum metrology triangle with the same uncertainty.
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