期刊
出版社
IEEE
DOI: 10.1109/RFIT.2009.5383725
关键词
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Susceptibility of radio frequency (RF) circuits against environmental noises was evaluated by way of direct power injection. Measurements performed on a 90-nm 2.45 GHz CMOS RF driver amplifier show that the injection of RF power into on-die p(+) guard bands creates tones at the primary and up-converted frequencies. Simulation achieves the error of less than 2dB against the measures susceptibility of -40dB, with the models of passive impedance networks covering probing tips, die pads, metal wirings, as well as a silicon substrate.
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