Micromechanical Model of a Thin Film Intrafascicular Electrode During Insertion into Peripheral Nerves

In this paper a thin film intrafascicular interface has been modeled during the insertion procedure inside peripheral nerves using a theoretical approach and a FEM analysis. In particular, the aim was to investigate the effects of several characteristics of the intraneural interfaces (e.g., the interface width and Kevlar filament diameter) on the maximal Von Mises stress reached during implantation. The results were used to gather new guidelines to develop more reliable thin film interfaces with maximal success rate during the implantation phase.