期刊
PHYSICAL REVIEW A
卷 80, 期 6, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevA.80.062904
关键词
-
资金
- National Science Foundation [PHY-0653623]
- Arizona TRIF imaging program
We report improved precision measurements of the van der Waals potential strength (C-3) for Na atoms and a silicon-nitride (SiNx) surface. We studied diffraction from nanofabricated gratings with a particular magic open fraction that allows us to determine C-3 without the need for separate measurements of the width of the grating openings. Therefore, finding the magic open fraction improves the precision of C-3 measurements. The same effect is demonstrated for a grating with an arbitrary open fraction by rotating it to a particular magic angle, yielding C-3=3.42 +/- 0.19 eV angstrom(3) for Na and a SiNx surface. This precision is sufficient to detect a change in C-3 due to a thin metal coating on the grating surface. We discuss the contribution to C-3 of core electrons and edge effects.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据