期刊
ADVANCED MATERIALS
卷 25, 期 6, 页码 899-903出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.201203731
关键词
electric-field screening; MoS2; two-dimensional crystals; ThomasFermi theory; electrostatic force microscopy (EFM)
类别
资金
- MICINN/MINECO (Spain) [MAT2011-25046]
- CONSOLIDER-INGENIO [CSD-2007-00010]
- Comunidad de Madrid [S2009/MAT-1726]
- European Union
- Marie Curie Grant [PIEF-GA-2009-251904]
The electrostatic screening in single and few-layer MoS2 sheets is studied. Electrostatic force microscopy is used to probe the electric field generated by charge impurities in the substrate and incompletely screened by MoS2 sheets. A non-linear Thomas-Fermi theory is employed to interpret the experimental results, demonstrating the important role of the interlayer coupling in the screening of MoS2.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据