Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization

ADVANCED MATERIALS

卷 25, 期 10, 页码 1440-1444

WILEY-V C H VERLAG GMBH

graphene; atomic force microscopy; tip wearing; electrochemical metallization; chemical vapor deposition

Chemistry, Multidisciplinary Chemistry, Physical Nanoscience & Nanotechnology Materials Science, Multidisciplinary Physics, Applied Physics, Condensed Matter

1. Major State Basic Research Development Program of China [2011CB013101]
2. National Natural Science Foundation of China (NSFC) [11225208, 11172001, 10872003, 10932001, 11250110211]
3. Program for the Author of National Excellent Doctoral Dissertation of China [2007B2]
4. Spanish Ministry of Science and Innovation [TEC2010-16126]
5. Generalitat de Catalunya [2009SGR-783, 2010BP-A00135]
6. NSFC
7. Alexander von Humboldt (AvH) foundation in Germany