4.8 Article

Nanoscale Structure and Mechanism for Enhanced Electromechanical Response of Highly Strained BiFeO3 Thin Films

期刊

ADVANCED MATERIALS
卷 23, 期 28, 页码 3170-+

出版社

WILEY-BLACKWELL
DOI: 10.1002/adma.201101164

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资金

  1. Army Research Office [W911NF-10-1-0482]
  2. Samsung Electronics Co., Ltd. [919 Samsung 2010-06795]
  3. U.S. Department of Energy [DE-FG02-07ER46453, DE-FG02-07ER46471]
  4. National Science Council [NSC-099-2811-M-009-003]

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The presence of a variety of structural variants in BiFeO3 thin films give rise to exotic electric-field-induced responses and resulting electromechanical responses as large as 5%. Using high-resolution X-ray diffraction and scanning-probe-microscopy-based studies the numerous phases present at the phase boundaries are identified and an intermediate monoclinic phase, in addition to the previously observed rhombohedral- and tetragonal-like phases, is discovered.

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