期刊
ADVANCED MATERIALS
卷 21, 期 27, 页码 2824-+出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200802156
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- European NODE [015783]
- BMBF [DIP-K 6.1]
A novel bottom imprint method to fabricate high-quality Si [100] nanowire arrays is demonstrated. This new approach combines the functions of a high-ordering AAO template as a stamp and template simultaneously. By the protective polymer layer in the hot imprint, the vertical 40 nm Si nanowire arrays grow epitaxially on the Si substrate with a narrow size distribution
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