期刊
ADVANCED MATERIALS
卷 21, 期 48, 页码 4992-+出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200902561
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资金
- Stichting Technologie en Wetenschap [07532]
- Stichting Fundamenteel Onderzoek der Materie (FOM)
- European Union [026019]
A newly developed SiN microhotplate allows specimens to be studied at temperatures up to 1000 K at a resolution of 100 picometer (see image). Aberration-corrected transmission electron microscopy has become a commonplace tool to investigate stable crystals; however, imaging transient nanocrystals is much more demanding. Morphological transformations in gold nanoparticles and layer-by-layer sublimation of PbSe nanocrystals is imaged with atomic resolution.
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