Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors

Scanning Kelvin probe microscopy (SKPM) of functioning solution-processed thin-film transistors is used to correlate film microstructure with device performance. As the channel length increases in these spun-cast devices, significant changes occur in the film microstructure within the device channel. These changes are observed with SKPM, and show a strong structure-function relationship.