期刊
ADVANCED MATERIALS
卷 20, 期 23, 页码 4513-4516出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200801780
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资金
- National Research Council/National Institute of Standards and Technology
- Office of Naval Research
Scanning Kelvin probe microscopy (SKPM) of functioning solution-processed thin-film transistors is used to correlate film microstructure with device performance. As the channel length increases in these spun-cast devices, significant changes occur in the film microstructure within the device channel. These changes are observed with SKPM, and show a strong structure-function relationship.
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