期刊
ADVANCED MATERIALS
卷 20, 期 19, 页码 3589-+出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200800742
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资金
- Ministry of Science and Technology (MOST) of Korea [MOST-2007-01156]
- Center of Fusion Technology for Security
- SRC program (Center for Nanotubes and Nanostructured Composites) of MOST/KOSEF [R11-2001-00002-0]
- Brain Korea 21 Project [KRF-2006-312-C00565]
- Nano Science and Technology Korea Research [KRF-2005-070-C00063]
- Korean Government (MOEHRD) [KRF-2006-311-C00307]
- MOST
- POSTECH
- Basic Research Program of KOSEF [R01-2006-000-11247]
Scanning photoemission microscopy (SPEM) images of a graphene flake as well as the C Is core level spectra for the mono- and multilayer graphene are measured. The samples with lateral dimensions on the micrometer scale are prepared on a SiO2 surface by direct exfoliation of crystalline graphite. Monolayer graphene is distinguished from the multilayer graphenes through the chemical contrast images of SPEM.
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