期刊
ADVANCED MATERIALS
卷 20, 期 19, 页码 3589-+出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200800742
关键词
-
类别
资金
- Ministry of Science and Technology (MOST) of Korea [MOST-2007-01156]
- Center of Fusion Technology for Security
- SRC program (Center for Nanotubes and Nanostructured Composites) of MOST/KOSEF [R11-2001-00002-0]
- Brain Korea 21 Project [KRF-2006-312-C00565]
- Nano Science and Technology Korea Research [KRF-2005-070-C00063]
- Korean Government (MOEHRD) [KRF-2006-311-C00307]
- MOST
- POSTECH
- Basic Research Program of KOSEF [R01-2006-000-11247]
Scanning photoemission microscopy (SPEM) images of a graphene flake as well as the C Is core level spectra for the mono- and multilayer graphene are measured. The samples with lateral dimensions on the micrometer scale are prepared on a SiO2 surface by direct exfoliation of crystalline graphite. Monolayer graphene is distinguished from the multilayer graphenes through the chemical contrast images of SPEM.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据