期刊
ADVANCED MATERIALS
卷 20, 期 10, 页码 1859-+出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200701460
关键词
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Freestanding copper nanowires (CuNWs) grown by CVD are analyzed by electron microscopy to show the details of a fivefold-twinned structure. The electron diffraction pattern discloses irregular mismatching of the twin boundaries. The electron emission characteristics of the CuNWs are presented, along with a CuNW-based proof-of-principle field-emission display (see figure).
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