期刊
ADVANCED MATERIALS
卷 20, 期 2, 页码 303-+出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200701607
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Stress-assisted grain growth at room temperature is identified as a plastic deformation mechanism in nanocrystalline thin films. Unique surface relief is attributed to the direct application of stress-coupled grain boundary migration theory. The figure shows a false-color SEM image of surface topography and an AFM height profile as a result of stress-assisted grain growth. A strategy for tailoring the mechanical properties of nanostructured metals is shown.
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