期刊
ADVANCED FUNCTIONAL MATERIALS
卷 23, 期 20, 页码 2539-2553出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adfm.201203432
关键词
nano-optics; near-field scanning optical microscopy; scanning probe microscopy; tip-enhanced; optical antennas
类别
资金
- Office of Science, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering, of the U.S. Department of Energy [DE-AC02-05CH11231]
Near-field optical microscopies and spectroscopies seek to investigate materials by combining the best aspects of optical characterization and scan-probe microscopy techniques. In principle, this provides access to chemical, morphological, physical and dynamical information at nanometer length scales that is impossible to access by other means. But a number of challenges, particularly on the scan-probe front, have limited the widespread application of near-field investigations. This work describes how recent probe engineering and technique innovation have addressed many of these challenges. This Feature Article begins with a short overview of the field, providing perspective and motivation for these developments and highlighting some key improvements. This is followed by a more in-depth description of the near-field advances developed at the Molecular Foundry, a national nanoscience User Facilityadvances that provide groundwork for generally-applicable nano-optical studies. Finally, a discussion is provided of what progress is still needed in order to realize the ultimate objective of translating all optical measurements to the nanoscale.
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