期刊
INFRARED PHYSICS & TECHNOLOGY
卷 71, 期 -, 页码 99-112出版社
ELSEVIER
DOI: 10.1016/j.infrared.2015.01.029
关键词
Infrared inspection; Infrared image processing; Defect detectability; Signal to noise ratio; Mean shift segmentation
资金
- COLCIENCIAS
Non-destructive testing (NDT) refers to inspection methods employed to assess a material specimen without impairing its future usefulness. An important type of these methods is infrared (IR) for NDT (IRNDT), which employs the heat emitted by bodies/objects to rapidly and noninvasively inspect wide surfaces and to find specific defects such as delaminations, cracks, voids, and discontinuities in materials. Current advancements in sensor technology for IRNDT generate great amounts of image sequences. These data require further processing to determine the integrity of objects. Processing techniques for IRNDT data implicitly looks for defect visibility enhancement. Commonly, IRNDT community employs signal to noise ratio (SNR) to measure defect visibility. Nonetheless, current applications of SNR are local, thereby overseeing spatial information, and depend on a-priori knowledge of defect's location. In this paper, we present a general framework to assess defect detectability based on SNR maps derived from processed IR images. The joint use of image segmentation procedures along with algorithms for filling regions of interest (ROI) estimates a reference background to compute SNR maps. Our main contributions are: (i) a method to compute SNR maps that takes into account spatial variation and are independent of a priori knowledge of defect location in the sample, (ii) spatial background analysis in processed images, and (iii) semi-automatic calculation of segmentation algorithm parameters. We test our approach in carbon fiber and honeycomb samples with complex geometries and defects with different sizes and depths. (C) 2015 Elsevier B.V. All rights reserved.
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