4.7 Article

Enhanced oxygen exchange and incorporation at surface grain boundaries on an oxide ion conductor

期刊

ACTA MATERIALIA
卷 60, 期 1, 页码 1-7

出版社

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2011.09.050

关键词

Grain boundary; Yttria stabilized zirconia; Secondary ion mass spectrometry

资金

  1. Center on Nanostructuring for Efficient Energy Conversion at Stanford University, an Energy Frontier Research Center
  2. US Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-SC0001060]
  3. ONR (TXDAD) [N00014-08-1-0544]
  4. Samsung

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This study reports spectrometric and spectroscopic evidence indicating a pronounced role of surface grain boundaries in enhancing oxygen incorporation on oxide ion conducting ceramic yttria stabilized zirconia (YSZ). Oxygen isotope exchange measurements were carried out using high spatial resolution (50 nm) secondary ion mass spectrometry (SIMS) under cathodically biased conditions as well as on bare YSZ surface. Surface mapping of the 180 distribution by SIMS clearly shows high activity at surface grain boundaries, suggesting that these boundary regions provide preferential pathways for oxygen incorporation into YSZ in both cases, albeit the effect is less pronounced without bias. The results are supported by a.c. impedance spectroscopy measurements conducted on polycrystalline YSZ membranes with surface grains engineered for different sizes, which indicate that smaller grains (i.e. higher grain boundary densities) exhibit lower electrode impedances. These results open up the possibility of engineering nanostructured YSZ surfaces containing a high density of grain boundaries to achieve enhanced performance of electrochemical devices, particularly for solid oxide fuel cells operating at low temperatures. (C) 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

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