期刊
ACTA MATERIALIA
卷 56, 期 6, 页码 1274-1287出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2007.11.040
关键词
serial-sectioning; electron backscattering diffraction (EBSD); crystal structure; modeling
This is the second of a two-part paper intended to develop a framework for collecting data, quantifying characteristics and subsequently representing microstructural information from polycrystalline materials. The framework is motivated by the need for incorporating accurate three-dimensional grain-level morphology and crystallography in computational analysis models that are currently gaining momentum. Following the quantification of microstructural features in the first part, this paper focuses on the development of models and codes for generating statistically equivalent synthetic micro structures. With input in the form of statistical characterization data obtained from serial-sectioning of the micro structures, this module is intended to provide computational modeling efforts with a microstructure representation that is statistically similar to the actual polycrystalline material. Published by Elsevier Ltd on behalf of Acta Materialia Inc.
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