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Three-dimensional profiling with binary fringes using phase-shifting interferometry algorithms

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APPLIED OPTICS
卷 50, 期 2, 页码 147-154

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OPTICAL SOC AMER
DOI: 10.1364/AO.50.000147

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  1. Programa de desarrollo de Ciencias Basicas (PEDECIBA) (Uruguay)
  2. Comision Sectorial de Investigacion Cientifica (CSIC, UdelaR, Uruguay)

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Three-dimensional shape measurements by sinusoidal fringe projection using phase-shifting interferometry algorithms are distorted by the nonlinear response in intensity of commercial video projectors and digital cameras. To solve the problem, we present a method that consists in projecting and acquiring a temporal sequence of strictly binary patterns, whose (adequately weighted) average leads to a sinusoidal fringe pattern with the required number of bits. Since binary patterns consist of ones and zeros-and no half-tones are involved-the nonlinear response of the projector and the camera will not play a role, and a nearly unit contrast gray-level sinusoidal fringe pattern is obtained. Validation experiments are presented. (C) 2011 Optical Society of America

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