4.8 Article

Single InAs Nanowire Room-Temperature Near-Infrared Photodetectors

期刊

ACS NANO
卷 8, 期 4, 页码 3628-3635

出版社

AMER CHEMICAL SOC
DOI: 10.1021/nn500201g

关键词

InAs nanowire; infrared photodetectors; half-wrapped top-gate; photoresponsivity; surface defect states

资金

  1. State Key Program for Basic Research of China [2014CB921600, 2013CB632705]
  2. National Natural Science Foundation of China [11322441, 11274331, 11334008, 61376015, 11104207]
  3. Shanghai Rising-Star Program

向作者/读者索取更多资源

Here we report InAs nanowire (NW) near-infrared photodetectors having a detection wavelength up to similar to 1.5 mu m. The single InAs NW photodetectors displayed minimum hysteresis with a high I-on/I-off ratio of 10(5). At room temperature, the Schottky-Ohmic contacted photodetectors had an external photoresponsivity of similar to 5.3 x 10(3) AW(-1), which is similar to 300% larger than that of Ohmic-Ohmic contacted detectors (similar to 1.9 x 10(3) AW(-1)). A large enhancement in photoresponsivity (similar to 300%) had also been achieved in metal Au-cluster-decorated InAs NW photodetectors due to the formation of Schottky junctions at the InAs/Au duster contacts. The photocurrent decreased when the photodetectors were exposed to ambient atmosphere because of the high surface electron concentration and rich surface defect states In InAs NWs. A theoretical model based on charge transfer and energy band change is proposed to explain this observed performance. To suppress the negative effects of surface defect states and atmospheric molecules, new InAs NW photodetectors with a half-wrapped top-gate had been fabricated by using 10 nm HfO2 as the top-gate dielectric.

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