4.8 Article

Variability in Carbon Nanotube Transistors: Improving Device-to-Device Consistency

期刊

ACS NANO
卷 6, 期 2, 页码 1109-1115

出版社

AMER CHEMICAL SOC
DOI: 10.1021/nn203516z

关键词

hysteresis; carbon nanotube transistors; threshold voltage; CNTFET; variability

资金

  1. NSF
  2. FENA Center of the Focus Center, a subsidiary of the Semiconductor Research Corporation
  3. IBM through the Stanford Center for Integrated Systems (CIS)

向作者/读者索取更多资源

The large amount of hysteresis and threshold voltage variation in carbon nanotube transistors impedes their use in highly integrated digital applications. The origin of this variability is elucidated by employing a top-coated, hydrophobic monolayer to passivate bottom-gated devices. Compared to passivating only the supporting substrate, it is found that covering the nanotube channel proves highly effective and robust at improving device-to-device consistency-hysteresis and threshold voltage variation are reduced by an average of 84 and 53%, respectively. The effect of gate and drain-source bias on hysteresis is considered, showing strong dependence that must be accounted for when analyzing the effectiveness of a passivation layer. These results provide both key insight into the origin of variability in carbon nanotube transistors and a promising path for resolving this significant obstacle.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.8
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据