4.8 Article

Morphology Control in Block Copolymer Films Using Mixed Solvent Vapors

期刊

ACS NANO
卷 6, 期 9, 页码 8052-8059

出版社

AMER CHEMICAL SOC
DOI: 10.1021/nn302641z

关键词

self-assembly; solvent vapor annealing; ps-pdms; block copolymer; toluene; heptane; self-consistent field theory

资金

  1. Semiconductor Research Corporation
  2. FENA Center
  3. Tokyo Electron
  4. Taiwan Semiconductor Manufacturing Company
  5. National Science Foundation

向作者/读者索取更多资源

Solvent vapor annealing of block copolymer thin films can produce a range of morphologies different from the equilibrium bulk morphology. By systematically varying the flow rate of two different solvent vapors (toluene and n-heptane) and an inert gas, phase maps showing the morphology versus vapor pressure of the solvents were constructed for 45 kg/mol polystyrene-block-polydimethylsiloxane diblock copolymer films of different thicknesses. The final morphology was correlated with the swelling of the block copolymer and homopolymer films and the solvent vapor annealing conditions. Self-consistent field theory is used to model the effects of solvent swelling. These results provide a framework for predicting the range of morphologies available under different solvent vapor conditions, which is important in lithographic applications where precise control of morphology and critical dimensions are essential.

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