期刊
ACS NANO
卷 5, 期 3, 页码 2142-2146出版社
AMER CHEMICAL SOC
DOI: 10.1021/nn1033423
关键词
graphene; polycrystalline; grain; grain boundary; transmission electron microscopy (TEM)
类别
资金
- Office of Energy Research, Materials Sciences and Engineering Division, of the U. S. Department of Energy [DE-AC02-05CH-11231]
- National Science Foundation within the Center of Integrated Nanomechanical Systems [EEC-0832819]
- National Science Foundation [0906539]
- U.S. Department of Energy [DE-AC02-05CH11231]
- Samsung Scholarship
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [0906539] Funding Source: National Science Foundation
We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies.
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