期刊
ACS NANO
卷 4, 期 6, 页码 3422-3428出版社
AMER CHEMICAL SOC
DOI: 10.1021/nn100356q
关键词
carbon nanotubes; graphene; nanostructuring; in situ electron microscopy; lattice defects
类别
资金
- Region Alsace [480-09]
- Agence Nationale de Recherche [ANR-09-BLAN-0363-01]
- Ministere de l'Enseignement Superieur et de la Recherche
- Agence Nationale de la Recherche (ANR) [ANR-09-BLAN-0363] Funding Source: Agence Nationale de la Recherche (ANR)
Lattice defects in carbon nanotubes and graphene are created by focusing an electron beam in a scanning transmission electron microscope onto a 0.1 nm spot on the objects. Metal atoms migrating on the graphenic surfaces are observed to be trapped by these defects. Depending on the size of the defect, single metal atoms or clusters of several atoms can be localized in or on nanotubes or graphene layers. Subsequent escape of the metal atoms from the trapping centers gives information about the bonding between the metal atom and the defect. The process of trapping and detrapping is studied in a temperature range of 20-670 degrees C. The technique allows one to place metal atoms with almost atomic precision in graphenic structures and to create a predefined pattern of foreign atoms in graphene or carbon nanotubes.
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