4.8 Article

Structural and Electronic Properties of PTCDA Thin Films on Epitaxial Graphene

期刊

ACS NANO
卷 3, 期 11, 页码 3431-3436

出版社

AMER CHEMICAL SOC
DOI: 10.1021/nn9008615

关键词

epitaxial graphene; silicon carbide; PTCDA; scanning tunneling microscopy; photoemission spectroscopy

资金

  1. NRFCRP [R-143-000-360-281]
  2. ARF [R-143-000-392-133, R-144000-192-116]

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In situ low-temperature scanning tunneling microscopy is used to study the growth of 3,4,9,10-perylene tetracarboxylic dianhydride (PTCDA) on epitaxial graphene (EG) on 6H-SiC(0001), as well as on HOPG for comparison. PTCDA adopts a layer-by-layer growth mode, with its molecular plane lying flat on both surfaces. The PTCDA films grow continuously over the EG step edges, but not on HOPG. STS performed on single-layer PTCDA on monolayer EG shows a wide band gap larger than 3.3 eV, consistent with pristine PTCDA films. Synchrotron-based high-resolution photoemission spectroscopy reveals weak charge transfer between PTCDA and EG. This suggests weak electronic coupling between PTCDA and the underlying EG layer.

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