期刊
ACS APPLIED MATERIALS & INTERFACES
卷 4, 期 10, 页码 5276-5280出版社
AMER CHEMICAL SOC
DOI: 10.1021/am301220h
关键词
zinc oxide; codoped ZnO; Kelvin probe force microscopy; bipolar charge; charge stability
资金
- National University of Singapore
- MoE AcRF [R-265-000-305-112]
- NRF-CRP [R284-000-056-281]
The bipolar charge phenomenon in Cu and Co co-doped zinc oxide (ZnO) film samples has been studied using scanning probe microscopy (SPM) techniques. Those ZnO samples are made using a pulsed laser deposition (PLD) technique. It is found that the addition of Cu and Co dopants suppresses the electron density in ZnO and causes a significant change in the work function (Fermi level) value of the ZnO film; this results in the ohmic nature of the contact between the electrode (probe tip) and codoped sample, whereas this contact exhibits a Schottky nature in the undoped and single-element-doped samples. These results are verified by Kelvin probe force microscopy (KPFM) and ultraviolet photoelectron spectroscopy (UPS) measurements. It is also found that the co-doping (Cu and Co) can stabilize the bipolar charge, whereas Cu doing only stabilizes the positive charge in ZnO thin films.
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