期刊
MICROSCOPY
卷 67, 期 -, 页码 -出版社
OXFORD UNIV PRESS
DOI: 10.1093/jmicro/dfx132
关键词
soft X-ray emission spectroscopy; bonding states; sodium borosilicide; B K-emission; Si L-emission
类别
资金
- Research Program of 'Dynamic Alliance for Open Innovation Bridging Human, Environment and Materials' in 'Network Joint Research Centre for Materials and Devices'
Chemical bonding state of sodium borosilicide Na8B74.5Si17.5, which is a new member of B-12-cluster materials, is investigated by soft X-ray emission spectroscopy. The material is composed of B-12 cluster network and characteristic silicon chains of [-Si-(Si-Si)(3)-Si-] connected by sp(3) bonding, in which bonding distances and bonding angles are close to those in cubic Si crystal. B K-emission spectrum of the material showed a similar but a broader intensity distribution with those of B-12 cluster materials of alpha-r-B, B4C and ss-r-B. The broader intensity distribution can be due to a variation of B-B bond length in B-12 cluster. The density of states (DOS) of silicon chains of [-Si-(Si-Si)(3)-Si-] was experimentally derived. It shows a similar energy width, and peak or shoulder structures in intensity distribution with those of L-emission spectrum of cubic Si. From comparisons between experimental spectra and corresponding calculated DOS, covalent bonding between Si chain and B-12 cluster network is suggested. Those are discussed by using a theoretically calculated density of state of Na8B74.5Si17.5 by using WIEN2k code.
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