期刊
MICROSCOPY
卷 67, 期 5, 页码 296-300出版社
OXFORD UNIV PRESS
DOI: 10.1093/jmicro/dfy027
关键词
tensile strain; tomography holder; electron tomography; soft materials
类别
资金
- JSPS KAKENHI, Japan [16H02288]
- ImPACT Program of Council for Science, Technology and Innovation (Cabinet Office, Government of Japan)
- Grants-in-Aid for Scientific Research [16H02288] Funding Source: KAKEN
An in situ straining holder capable of tensile deformation and high-angle tilt for electron tomography was developed for polymeric materials. The holder has a dedicated sample cartridge, on which a variety of polymeric materials, such as microtomed thin sections of bulk specimens and solvent-cast thin films, can be mounted. Fine, stable control of the deformation process with nanoscale magnification was achieved. The holder allows large tensile deformation (similar or equal to 800 mu m) with a large field of view (800 x 200 mu m before the deformation), and a high tilt angle (+/- 75 degrees) during in situ observations. With the large tensile deformation, the strain on the specimen can be as large as 26, at least one order of magnitude larger than the holder's predecessor. We expect that meso- and microscopic insights into the dynamic mechanical deformation and fracture processes of polymeric materials can be obtained by combining the holder with a transmission electron microscope equipped with an energy filter. The filter allows zero-loss imaging to improve the resolution and image contrast for thick specimens. We used this technique to study the deformation process in a silica nanoparticle-filled isoprene rubber.
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