期刊
JOURNAL OF APPLIED CRYSTALLOGRAPHY
卷 51, 期 -, 页码 249-256出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S160057671800239X
关键词
neutron reflectometry; polarized neutrons; off-specular scattering; D17
The vertical sample-plane reflectometer D17 at the Institut Laue-Langevin in Grenoble, France, has undergone several major upgrades since its commissioning, which are summarized in this article. The three major improvements are (i) a new focusing guide, increasing the usable flux on the sample by a factor of 2.5; (ii) a new beam polarizer and new spin flippers, allowing for the use of polarized neutrons in time-of-flight mode; and (iii) a new detector with a particularly uniform response under homogeneous exposure, improved stability and state-of-the-art detector electronics. The combination of these factors has paved the road to new possibilities in fast kinetic measurements, magnetism and off-specular scattering. Examples and scientific references for the new capabilities are presented.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据