期刊
IEEE TRANSACTIONS ON POWER ELECTRONICS
卷 30, 期 8, 页码 4079-4090出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TPEL.2014.2352863
关键词
Loss measurement; power MOSFET; power semiconductor devices; silicon carbide; switching loss
Silicon (Si) insulated-gate bipolar transistors are widely used in railway traction converters. In the near future, silicon carbide (SiC) technology will push the limits of switching devices in three directions: higher blocking voltage, higher operating temperature, and higher switching speeds. The first silicon carbide (SiC) MOSFET modules are available on the market and look promising. Although they are still limited in breakdown voltage, these wide-bandgap components should improve traction-chain efficiency. Particularly, a significant reduction in the switching losses is expected which should lead to improvements in power-weight ratios. Nevertheless, because of the high switching speed and the high current levels required by traction applications, the implementation of these new modules is critical. An original method is proposed to compare, in terms of stray inductance, several dc bus-bar designs. To evaluate the potential of these new devices, a first set of measurements, based on a single-pulse test-bench, was obtained. The switching behavior of SiC devices was well understood at turn-off and turn-on. To complete this work, the authors use an opposition method to compare Si-IGBT and SiC-MOSFET modules in voltage source inverter operation. For this purpose, a second test-bench, allowing electrical and thermal measurements, was developed. Experimental results confirm the theoretical loss-calculation of the single-pulse tests and the correct operation of up to three modules directly connected in parallel. This analysis provides guidelines for a full SiC inverter design, and prospects for developments in traction applications are presented.
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