期刊
ACS PHOTONICS
卷 5, 期 4, 页码 1196-1201出版社
AMER CHEMICAL SOC
DOI: 10.1021/acsphotonics.7b01518
关键词
2D materials; hexagonal boron nitride; near-field scanning optical microscopy; optical constants
类别
资金
- NSF EFRI [1542807]
- National Science Foundation under NSF ECCS Award [1541959]
- Swiss National Science Foundation (SNSF) Grant [168545]
- Elemental Strategy Initiative by the MEXT, Japan
- JSPS KAKENHI Grant [JP15K217]
- Directorate For Engineering
- Emerging Frontiers & Multidisciplinary Activities [1542807] Funding Source: National Science Foundation
Guided modes in nanometer thick anisotropic van der Waals materials are experimentally investigated and their refractive indices in visible wavelengths are extracted. Our method involves near-field scanning optical microscopy of waveguide (transverse electric) and surface plasmon polariton (transverse magnetic) modes in h-BN/SiO2/Si and Ag/h-BN stacks, respectively. We determine the dispersion of these modes and use this relationship to extract anisotropic refractive indices of h-BN flakes. In the wavelength interval 550-700 nm, the in-plane and out-of-plane refractive indices are in the range 1.98-2.12 and 1.45-2.12, respectively. Our approach of using near-field scanning optical microscopy allows for the direct study of the interaction between light and two-dimensional van der Waals materials and heterostructures.
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