4.6 Article

Designing effective Si/Ag interface via controlled chemical etching for photoelectrochemical CO2 reduction

期刊

JOURNAL OF MATERIALS CHEMISTRY A
卷 6, 期 44, 页码 21906-21912

出版社

ROYAL SOC CHEMISTRY
DOI: 10.1039/c8ta05420g

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资金

  1. Ministry of Science and Technology of China [2017YFA0204800]
  2. National Natural Science Foundation of China [51472173, 51522208]
  3. Natural Science Foundation of Jiangsu Province [SBK2015010320]
  4. Priority Academic Program Development of Jiangsu Higher Education Institutions
  5. Collaborative Innovation Center of Suzhou Nano Science

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Photoelectrochemical reduction of CO2 to value-added chemicals represents a promising approach for artificial photosynthesis, but often suffers from limited selectivity and stability. Improving its performance would require proper design of semiconductor and cocatalyst materials, along with a strategy for effective coupling. Here, we report that controlled chemical etching of Si wafer by Ag+ ions yields effective semiconductor/co-catalyst interface for photoelectrochemical CO2 reduction. Resultant photocathodes exhibit large photocurrent density (similar to 10 mA cm(-2) under 0.5 sun), great CO faradaic efficiency (90% at -0.5 V versus reversible hydrogen electrode), and impressive operational stability (little activity or selectivity loss within 8 h). Further enhancement (by similar to 20%) of photocurrent density is achieved by combining photolithography patterning with chemical etching. Our study applies long-known chemistry as an unexpected solution and may provide a new strategy for highperformance photoelectrochemical CO2 reduction.

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