4.4 Article Proceedings Paper

Co-based amorphous thin films on silicon with soft magnetic properties

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AIP ADVANCES
卷 8, 期 5, 页码 -

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AMER INST PHYSICS
DOI: 10.1063/1.5007733

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资金

  1. Enterprise Ireland (EI) [CF20160447a]
  2. Science Foundation Ireland (SFI) [15/SIRG/3569, 15/IA/3180]
  3. Analog Devices
  4. Tokyo Electron Magnetic Solutions Ltd.
  5. Science Foundation Ireland (SFI) [15/SIRG/3569] Funding Source: Science Foundation Ireland (SFI)

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The present work investigates the emergence of multiple modes in the high-frequency permeability spectrum of Co-Zr-Ta-B amorphous thin films. Amorphous thin films of different thicknesses (t=100-530 nm) were deposited by DC magnetron sputtering. Their static and dynamic soft magnetic properties were investigated to explore the presence of multi-magnetic phases in the films. A two-phase magnetic behavior of the thicker films (>= 333 nm) was revealed by the in-plane hysteresis loops. Multiple resonance peaks were observed in the high-frequency permeability spectrum of the thicker films. The thickness dependent multiple resonance peaks below the main ferromagnetic resonance (FMR) can be attributed to the two-phase magnetic behaviors of the films. (C) 2017 Author(s).

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