4.8 Article

Efficient Shape Reconstruction of Microlens Using Optical Microscopy

期刊

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
卷 62, 期 12, 页码 7655-7664

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIE.2015.2454480

关键词

Microlens; optical diffusion; polydimethylsiloxane (PDMS); relative blurring; shape from defocus (SFD)

资金

  1. Natural Science Foundation of China [61305025, 61473282]
  2. Fundamental Research Funds for the Central Universities [N13050411]

向作者/读者索取更多资源

The imaging properties of a microlens are highly related to its 3-D profile; therefore, it is of fundamental importance to measure its 3-D geometrical characteristics with high accuracy after industrial fabrication. However, common 3-D measurement tools are difficult to use for fast, noninvasive, and precise 3-D measurement of amicrolens. Depth acquisition is a direct way to understand the 3-D properties of objects in computer vision, and shape from defocus (SFD) has been demonstrated to be effective for 3-D reconstruction. In this paper, a depth reconstruction method from blurring using optical microscopy and optical diffraction is proposed to reconstruct the global shape of a microlens. First, the relationship between the intensity distribution and the depth information is introduced. Second, a blurring imaging model with optical diffraction is formulated through curve fitting, accounting for relative blurring and heat diffusion, and a new SFD method with optical diffraction and defocused images is proposed. Finally, a polydimethylsiloxane (PDMS) microlens is used to validate the proposed SFD method, and the results show that its global shape can be reconstructed with high precision. The average estimation error is 77 nm, and the cost time is reduced by 92.5% compared with atomic force microscopy scanning.

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