期刊
INTERNATIONAL CONFERENCE ON SOLID STATE DEVICES AND MATERIALS SCIENCE
卷 25, 期 -, 页码 150-157出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.phpro.2012.03.064
关键词
Thermal evaporation; SnS films; Film thickness effect; Optical properties
Thin films of tin sulphide (SnS) were prepared on glass substrates using the thermal evaporation method and the optical dispersion parameters investigated. The results obtained on the dispersion parameters and other optical constants indicated a strong thickness dependency. The results indicated that the refractive index data obeyed the single oscillator model. The dispersion energy (E-d), optical spectra moments (M-1) and (M-3) and the dielectric constant (epsilon) were all found to decrease with increase of film thicknesses. However, the oscillator energy (E-o) and angular frequency (omega(p)) are independent of film thickness. These results are useful tool for further understanding the electronic structure for this novel material. (C) 2011 Published by Elsevier B.V. Selection and/or peer-review under responsibility of Garry Lee
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