期刊
2013 14TH IEEE LATIN-AMERICAN TEST WORKSHOP (LATW2013)
卷 -, 期 -, 页码 -出版社
IEEE
关键词
OxRRAM; ReRAM; SEE; SPICE simulation
As emerging non-volatile memories, based on resistive switching mechanisms, are attractive candidates to overcome future power issues, this paper proposes to analyze Single Event Effects in circuitry surrounding OxRRAMs. The impact of a particle crossing the circuit is presented. A threshold effect is pointed out even if the probability of SEE occurrence is shown to be low in common technologies.
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