期刊
IEEE ELECTRON DEVICE LETTERS
卷 36, 期 8, 页码 856-858出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2015.2450835
关键词
CdTe; surface etching; nuclear radiation detector; spectroscopy
资金
- Japan Society for the Promotion of Science (JSPS) [A-25242048]
- Grants-in-Aid for Scientific Research [25242048] Funding Source: KAKEN
Chemical etching of CdTe crystals using hydrogen bromide (HBr)-based etchant was studied and its effectiveness in detector leakage current, gamma radiation detection performance was compared with that of a conventional Br-methanol (BM) etched detector. It was found that effect of surface leakage in total detector leakage current was lower in the HBr-processed detectors, and they also exhibited better radiation detection performances than that of the conventional BM-etched detectors. A slight variation in surface chemical states was found in these differently processed crystals which could be related to the observed differences in detector properties.
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