4.8 Article

All-Electrical Determination of Crystal Orientation in Anisotropic Two-Dimensional Materials

期刊

PHYSICAL REVIEW LETTERS
卷 120, 期 8, 页码 -

出版社

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.120.086801

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资金

  1. Air Force Office of Scientific Research [FA95501510247, FA05501510377]
  2. National Science Foundation Materials Research Science and Engineering Center (MRSEC) of Northwestern University [DMR-1121262, DMR-1720139]
  3. Soft and Hybrid Nanotechnology Experimental (SHyNE) Resource [NSF ECCS-1542205]
  4. MRSEC program at the Materials Research Center [DMR-1720139, NSF DMR-1121262]
  5. International Institute for Nanotechnology (IIN)
  6. Keck Foundation
  7. State of Illinois, through the IIN

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The crystal orientation of an exfoliated black phosphorous flake is determined by purely electrical means. A sequence of three resistance measurements on an arbitrarily shaped flake with five contacts determines the three independent components of the anisotropic in-plane resistivity tensor, thereby revealing the crystal axes. The resistivity anisotropy ratio decreases linearly with increasing temperature T and carrier density reaching a maximum ratio of 3.0 at low temperatures and densities, while mobility indicates impurity scattering at low T and acoustic phonon scattering at high T.

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