期刊
PHYSICAL REVIEW LETTERS
卷 120, 期 15, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.120.156101
关键词
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资金
- European Research Council under the European Union's Seventh Framework Programme (FP7)/ERC [320832]
- JURECA in the Julich Supercomputing Centre (JSC) (JARA-HPC) [JIAS16, JPGI90]
An absolute scale match between experiment and simulation in atomic-resolution off-axis electron holography is demonstrated, with unknown experimental parameters determined directly from the recorded electron wave function using an automated numerical algorithm. We show that the local thickness and tilt of a pristine thin WSe2 flake can be measured uniquely, whereas some electron optical aberrations cannot be determined unambiguously for a periodic object. The ability to determine local specimen and imaging parameters directly from electron wave functions is of great importance for quantitative studies of electrostatic potentials in nanoscale materials, in particular when performing in situ experiments and considering that aberrations change over time.
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