期刊
JOURNAL OF CONTROL AUTOMATION AND ELECTRICAL SYSTEMS
卷 24, 期 3, 页码 223-231出版社
SPRINGER
DOI: 10.1007/s40313-013-0034-1
关键词
Chaos; Atomic force microscopy (AFM); Optimal linear feedback control (OLFC); State-dependent Riccati equation (SDRE)
资金
- CNPq (Conselho Nacional de Desenvolvimento Cientifico)
- FAPESP (Fundacao de Amparo a Pesquisa do estado de Sao Paulo)
The performance of the optimal linear feedback control and of the state-dependent Riccati equation control techniques applied to control and to suppress the chaotic motion in the atomic force microscope are analyzed. In addition, the sensitivity of each control technique regarding to parametric uncertainties are considered. Simulation results show the advantages and disadvantages of each technique.
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