期刊
OPTICS AND LASERS IN ENGINEERING
卷 108, 期 -, 页码 41-53出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.optlaseng.2018.04.017
关键词
Plenoptic camera; Microlens array; Error identification; Calibration; Light-field imaging
类别
资金
- National Natural Science Foundation of China [51776051, 51327803]
A microlens array (MLA) is a key optical element in light-field imaging, but surface errors caused by manufacturing defects can result in the loss and deviation of light-field information transmission. To address this issue, we establish a local error model for an MLA arranged in a matrix form, and develop a method for identifying error microlenses based on image quality evaluation indexes. The local imaging characteristics and degradation mechanism of three basic errors are analyzed through simulation. The local errors on different microlenses cause different degradations of the corresponding sub-images, and the trend of change in light-field image quality is related to the error type, error value, and error direction. The simulation results also verify the accuracy and effectiveness of the proposed method and models.
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